发明名称 TEST SYSTEM, AND DRIVING APPARATUS AND METHOD THEREOF
摘要 The present invention relates to a driving unit for a test system. An example of the driving unit for a test system includes a first tray sensing unit which senses whether a first tray exists in a first tray storage unit; a second tray sensing unit which senses whether a second tray exists in a second tray storage unit; a moving plate driving unit which moves a moving plate on which the first and the second tray storage units are placed; a tray test position movement sensing unit which senses whether the first or the second tray which moves by following a transfer unit is moved to a test position; a control unit which is connected to the first and the second tray sensing unit and to the tray test position movement sensing unit; a first component transfer unit driving device which drives a first component transfer unit for moving a first and second electronic components on the transfer unit to a test device; and a third component transfer unit driving device which drives a third component transfer unit for classifying the first and the second electronic components of which the testing is completed by grade according to the test results and placing the components into corresponding grade box among a plurality of grade boxes.
申请公布号 KR101417909(B1) 申请公布日期 2014.08.18
申请号 KR20130050515 申请日期 2013.05.06
申请人 AMT CO., LTD. 发明人 KIM, WON;LEE, JONG SEONG
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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