发明名称 300MM POLISHED SILICON WAFER MANUFACTURING PROCESS BY HIGH TEMPERATURE HEAT TREATMENT
摘要 A 300mm silicon wafer manufacturing process by high temperature heat treatment, comprising the process steps of: crystal pulling, slicing angle guiding, double-sided grinding, double-sided polishing, final polishing and high temperature heat treatment. In the manufacturing process of the present invention, the double-sided grinding step is retained, and grinding is directly followed by polishing, eliminating the single-sided grinding step; and the micro-damage on the surface layer not eliminated by the polishing process is removed by the subsequent high temperature heat treatment. The process flow is simple, and can improve both production efficiency and silicon wafer quality.
申请公布号 KR20140100560(A) 申请公布日期 2014.08.14
申请号 KR20147018302 申请日期 2011.12.15
申请人 GRINM ADVANCED MATERIALS CO., LTD. 发明人 FENG QUANLIN;YAN ZHIRUI;HE ZIQIANG;SHENG FANGYU;ZHAO ERJING;LI ZONGFENG
分类号 H01L21/304;B24B29/00;H01L21/324 主分类号 H01L21/304
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