Automatic Test Equipment

摘要

Embodiments of the present invention provide an automatic test equipment. The automatic test equipment is configured to receive an input signal from a device under test and to write an information describing the input signal to a memory. The automatic test equipment is further configured to read the information describing the input signal from the memory and to provide an output signal for the device under test based on the information describing the input signal read from the memory.

主权项

1. An automatic test equipment,
wherein the automatic test equipment is configured to receive an input signal from a device under test and to write an information describing the input signal to a memory; and wherein the automatic test equipment is configured to read the information describing the input signal from the memory and to provide an output signal for the device under test based on the information describing the input signal read from the memory; and wherein the device under test comprises a built in self test unit, wherein the automatic test equipment is coupled to the device under test to receive a signal provided by the built in self test unit as the input signal and to provide the output signal to the built in self test unit.