发明名称 |
METAL-INSULATOR-METAL CAPACITOR UNDER REDISTRIBUTION LAYER |
摘要 |
A metal-insulator-metal (MIM) capacitor reduces a number of masks and processing steps compared to conventional techniques. A first conductive layer of a MIM capacitor is deposited on a semiconductor chip and patterned using a MIM conductive layer mask. A conductive redistribution layer (RDL) is patterned over the MIM dielectric layer. The conductive redistribution layer includes two RDL nodes that overlap the first conductive layer of the MIM capacitor. A conductive via or bump extends through the MIM dielectric layer and couples one of the RDL nodes to the first conductive layer of the MIM capacitor. |
申请公布号 |
US2014225224(A1) |
申请公布日期 |
2014.08.14 |
申请号 |
US201313765015 |
申请日期 |
2013.02.12 |
申请人 |
QUALCOMM INCORPORATED |
发明人 |
Zhu John J.;Chidambaram PR;Nallapati Giridhar;Yeap Choh fei |
分类号 |
H01L49/02 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of constructing a metal-insulator-metal (MIM) capacitor, comprising:
depositing a MIM capacitor conductive layer on a semiconductor chip; patterning the MIM capacitor conductive layer using a single MIM capacitor mask; depositing a MIM dielectric layer on the MIM capacitor conductive layer; patterning a redistribution layer (RDL) on the MIM dielectric layer, the redistribution layer including a first RDL node overlapping the MIM capacitor conductive layer and a second RDL node overlapping the MIM capacitor conductive layer; and fabricating a conductive inter-layer pathway that couples to the MIM capacitor conductive layer. |
地址 |
San Diego CA US |