发明名称 METAL-INSULATOR-METAL CAPACITOR UNDER REDISTRIBUTION LAYER
摘要 A metal-insulator-metal (MIM) capacitor reduces a number of masks and processing steps compared to conventional techniques. A first conductive layer of a MIM capacitor is deposited on a semiconductor chip and patterned using a MIM conductive layer mask. A conductive redistribution layer (RDL) is patterned over the MIM dielectric layer. The conductive redistribution layer includes two RDL nodes that overlap the first conductive layer of the MIM capacitor. A conductive via or bump extends through the MIM dielectric layer and couples one of the RDL nodes to the first conductive layer of the MIM capacitor.
申请公布号 US2014225224(A1) 申请公布日期 2014.08.14
申请号 US201313765015 申请日期 2013.02.12
申请人 QUALCOMM INCORPORATED 发明人 Zhu John J.;Chidambaram PR;Nallapati Giridhar;Yeap Choh fei
分类号 H01L49/02 主分类号 H01L49/02
代理机构 代理人
主权项 1. A method of constructing a metal-insulator-metal (MIM) capacitor, comprising: depositing a MIM capacitor conductive layer on a semiconductor chip; patterning the MIM capacitor conductive layer using a single MIM capacitor mask; depositing a MIM dielectric layer on the MIM capacitor conductive layer; patterning a redistribution layer (RDL) on the MIM dielectric layer, the redistribution layer including a first RDL node overlapping the MIM capacitor conductive layer and a second RDL node overlapping the MIM capacitor conductive layer; and fabricating a conductive inter-layer pathway that couples to the MIM capacitor conductive layer.
地址 San Diego CA US