发明名称 Through-substrate vias and methods for forming the same
摘要 A device includes a semiconductor substrate and a Metal-Oxide-Semiconductor (MOS) transistor. The MOS transistor includes a gate electrode over the semiconductor substrate, and a source/drain region on a side of the gate electrode. A source/drain contact plug includes a lower portion and an upper portion over the lower portion, wherein the source/drain contact plug is disposed over and electrically connected to the source/drain region. A gate contact plug is disposed over and electrically connected to the gate electrode, wherein a top surface of the gate contact plug is level with a top surface of the top portion of the source/drain contact plug. A Through-Substrate Via (TSV) extends into the semiconductor substrate. A top surface of the TSV is substantially level with an interface between the gate contact plug and the gate electrode.
申请公布号 US8803292(B2) 申请公布日期 2014.08.12
申请号 US201213457823 申请日期 2012.04.27
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chen Ming-Fa;Wang Yu-Young;Jan Sen-Bor
分类号 H01L29/40 主分类号 H01L29/40
代理机构 Slater and Matsil, L.L.P. 代理人 Slater and Matsil, L.L.P.
主权项 1. A device comprising: a semiconductor substrate; a Metal-Oxide-Semiconductor (MOS) transistor comprising: a gate electrode over the semiconductor substrate; anda source/drain region on a side of the gate electrode; a source/drain contact plug comprising a lower portion and an upper portion over the lower portion, wherein the source/drain contact plug is over and electrically connected to the source/drain region; a gate contact plug over and electrically connected to the gate electrode, wherein a top surface of the gate contact plug is level with a top surface of the upper portion of the source/drain contact plug; and a Through-Substrate Via (TSV) extending into the semiconductor substrate, wherein a top surface of the TSV is level with an interface between the gate contact plug and the gate electrode.
地址 Hsin-Chu TW