APPARATUS OF PROBE FOR KELVIN TEST

摘要

The present invention relates to a probe device for a Kelvin test by being in contact with a terminal of a device. The probe device comprises a contact layer stacked on the lower end and having conductivity; an interposer layer stacked on the upper part of the contact layer and including a plurality of openings; a first probe inserted into the opening of the interposer layer and in contact with the contact layer at one end; a second probe in contact with the upper part of the interposer layer at one end; and a load board in contact with the other end of the probes and fixing the probes. The interposer layer short-circuits the probes so as to perform a Kelvin test even with lower integration than a width of the terminal of the device.