| 摘要 |
<p>This X-ray diffraction measurement apparatus is provided with a casing (60), said casing (60) having accommodated therein: an X-ray emitter (10) which emits X-rays towards an object (OB) to be measured; a table (20) having an imaging plate (21) attached thereto; a laser detection device (40) which irradiates the imaging plate (21) with laser light, receives emitted light, and outputs a received-light signal corresponding to the received-light intensity; a spindle motor (37) which causes the table (20) to rotate around a central axis; and a feed motor (32) which moves the table (20) in a direction parallel to a light-receiving surface of the imaging plate (21). The casing (60) is provided with an inclined-surface wall (67) which is placed upon the object (OB) to be measured. A through hole (67a) through which emitted X-rays are made to pass is provided in the inclined-surface wall (67). The inclined-surface wall (67) forms a prescribed angle with the direction of the optical axis of the emitted X-rays.</p> |
