| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a semiconductor device having an output impedance adjustment circuit which implements a high accuracy test of an output impedance variable under a variety of conditions by a simple procedure.SOLUTION: For automatically adjusting an output impedance of an output circuit section 15 including a plurality of transistors connected in parallel, the output impedance adjustment circuit of the semiconductor device includes: a replica circuit section 11 including a circuit part having the same configuration as the output circuit section 15; a comparison section 12 for outputting a result of magnitude comparison of an output impedance of the replica circuit section 11 with a reference resistance in the form of internal counter control signals ISp, ISn; and a counter control circuit 13 for performing a counting operation and outputting adjustment codes Cp, Cn as selectively switching between external counter control signals ESp, ESn and the internal counter control signals ISp, ISn. The adjustment codes Cp, Cn are supplied to the output circuit section 15 and the replica circuit section 11, and the plurality of transistors are controlled on/off on the basis of the adjustment codes Cp, Cn.</p> |
