发明名称 |
CURVATURE MEASURING APPARATUS AND CURVATURE MEASURING METHOD |
摘要 |
The present invention relates to a curvature measurement device. The curvature measurement device according to an embodiment of the present invention includes a housing detachably provided on an installation; a first measurement member provided in the housing in a tapeline to be drawn out; a second measurement member provided in the housing in a tapeline to be drawn out; and a processing unit determining whether a curve section of the installation satisfies a design value by using first data measured in the first measurement member and second data measured in a second measurement member. |
申请公布号 |
KR101422695(B1) |
申请公布日期 |
2014.07.24 |
申请号 |
KR20130030879 |
申请日期 |
2013.03.22 |
申请人 |
SAMSUNG HEAVY IND. CO., LTD. |
发明人 |
KIM, TAE SIK |
分类号 |
G01B5/20 |
主分类号 |
G01B5/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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