发明名称 CURVATURE MEASURING APPARATUS AND CURVATURE MEASURING METHOD
摘要 The present invention relates to a curvature measurement device. The curvature measurement device according to an embodiment of the present invention includes a housing detachably provided on an installation; a first measurement member provided in the housing in a tapeline to be drawn out; a second measurement member provided in the housing in a tapeline to be drawn out; and a processing unit determining whether a curve section of the installation satisfies a design value by using first data measured in the first measurement member and second data measured in a second measurement member.
申请公布号 KR101422695(B1) 申请公布日期 2014.07.24
申请号 KR20130030879 申请日期 2013.03.22
申请人 SAMSUNG HEAVY IND. CO., LTD. 发明人 KIM, TAE SIK
分类号 G01B5/20 主分类号 G01B5/20
代理机构 代理人
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