APPARATUS FOR SPINNING TEST TRAY OF IN-LINE TEST HANDLER AND IN-LINE TEST HANDLER

摘要

Disclosed is an apparatus for spinning a test tray and an in-line test handler including the above apparatus, wherein the apparatus may include a supporting unit for supporting a test tray transported between first and second chamber units facing in the different directions, wherein the first chamber unit is provided at a predetermined interval from the second chamber unit; a base unit to which the supporting unit is spinnably connected; and a spinning unit which spins the test tray so that semiconductor devices received in the test tray are tested at the same arrangement in each of the first chamber unit and the second chamber unit.

主权项

1. An in-line test handler comprising:
a first chamber unit for carrying out a testing process of a semiconductor device; a second chamber unit for carrying out a testing process of a semiconductor device, wherein the first and second chamber units facing in the different directions are provided at a predetermined interval from each other; a sorting unit for carrying out a loading process for receiving the semiconductor device to be tested in the test tray, and an unloading process for detaching the tested semiconductor device from the test tray, wherein the sorting unit is provided at a predetermined interval from the first chamber unit and the second chamber unit; a conveyor unit for transporting the test tray so as to make the sorting unit, the first chamber unit and the second chamber connected in-line; and a spinning apparatus for spinning the test tray, which spins the test tray so as to carry out the testing process under the circumstances that the semiconductor devices received in the test tray are arranged at the same position in each of the first chamber unit and the second chamber unit.