| 发明名称 | Test circuit for use in a semiconductor apparatus | ||
| 摘要 | A test circuit that senses a misaligned probe during a test includes a first power control section that senses voltage levels of a plurality of sensing lines and controls power supplied to a lower circuit section provided below a part of a pad group, and a second power control section that selectively provides an internal voltage in response to a sensing result of the first power control section. | ||
| 申请公布号 | US8786302(B2) | 申请公布日期 | 2014.07.22 |
| 申请号 | US201113159178 | 申请日期 | 2011.06.13 |
| 申请人 | SK hynix Inc. | 发明人 | Choi Hong-Sok |
| 分类号 | G01R31/20 | 主分类号 | G01R31/20 |
| 代理机构 | Baker & McKenzie LLP | 代理人 | Baker & McKenzie LLP |
| 主权项 | 1. A semiconductor apparatus comprising: first and second pad groups, wherein each pad in the pad groups includes an edge region surrounding a region to be probed; a plurality of sensing lines provided below a part of the edge region of at least one of the pads in the first pad group; a circuit section under at least one of the pads of the first or second pad groups; and a test circuit configured to sense a short circuit between the at least one of the pads in the first pad group and the plurality of sensing lines thereby sensing abnormal pressure of a probe,control the operation of the circuit section, andmonitor the circuit section. | ||
| 地址 | KR | ||