发明名称 NONVOLITILE MEMORY DEVICE AND READ METHOD THEREOF
摘要 The present invention relates to a nonvolatile memory device and a read method thereof, more specifically, to a resistance memory device including a resistance material and a read method thereof. The nonvolatile memory device according to the present invention includes a main area including main cells connected to word lines and main bit lines and reference cells which connect the word lines to the reference bit lines. A reference area programmed with the same read condition as the main area includes a reference sensing amplification circuit for reading data written on the reference area through the reference bit lines in the read operation and a control logic which controls the reference sensing amplification circuit to read the data written in the reference area by shifting the data with the predetermined-weighted value to use data written in the reference area as the read reference value of the main area in the read operation. The resistance memory device and a read method thereof according to the present invention guarantees resistance drift without increasing control complexity.
申请公布号 KR20140090879(A) 申请公布日期 2014.07.18
申请号 KR20130003065 申请日期 2013.01.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SUNG YEON;LEE, YEONG TAEK;LIM, KI WON;CHUNG, WON RYUL
分类号 G11C13/00;G11C16/26;G11C16/34 主分类号 G11C13/00
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