发明名称 |
NONVOLITILE MEMORY DEVICE AND READ METHOD THEREOF |
摘要 |
The present invention relates to a nonvolatile memory device and a read method thereof, more specifically, to a resistance memory device including a resistance material and a read method thereof. The nonvolatile memory device according to the present invention includes a main area including main cells connected to word lines and main bit lines and reference cells which connect the word lines to the reference bit lines. A reference area programmed with the same read condition as the main area includes a reference sensing amplification circuit for reading data written on the reference area through the reference bit lines in the read operation and a control logic which controls the reference sensing amplification circuit to read the data written in the reference area by shifting the data with the predetermined-weighted value to use data written in the reference area as the read reference value of the main area in the read operation. The resistance memory device and a read method thereof according to the present invention guarantees resistance drift without increasing control complexity. |
申请公布号 |
KR20140090879(A) |
申请公布日期 |
2014.07.18 |
申请号 |
KR20130003065 |
申请日期 |
2013.01.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SUNG YEON;LEE, YEONG TAEK;LIM, KI WON;CHUNG, WON RYUL |
分类号 |
G11C13/00;G11C16/26;G11C16/34 |
主分类号 |
G11C13/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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