| 摘要 |
A thermal-mechanical testing apparatus (100) for use with an electrically conductive specimen testing system. The apparatus includes a first compression anvil assembly (102), a mounting frame (104) coupled to the first compression anvil assembly (102), and a second compression anvil assembly (106) positioned opposite the first compression anvil assembly (102) and mounting frame (104). The first compression anvil assembly (102) includes a mounting plate (108), a first compression anvil (llO)coupled to the mounting plate (108), and a heating current ground system (112) coupled to the mounting plate (108). The mounting frame (104) includes a set of conductive end plates (114), a set of insulating connectors (120) connecting the conductive end plates (114), and a plurality of mounting components coupled to the insulating connectors (120) an mounting plate (108). The second compression anvil assembly (106) includes a conductive mounting plate (124), a second compression anvil (128)coupled to the conductive mounting plate (124), and a heating current by-pass system (132) coupled to the conductive mounting plate (124) and one of the conductive end plates (114). |
