发明名称 Nonvolatile semiconductor memory transistor, nonvolatile semiconductor memory, and method for manufacturing nonvolatile semiconductor memory
摘要 A nonvolatile semiconductor memory transistor included in a nonvolatile semiconductor memory includes an island-shaped semiconductor having a source region, a channel region, and a drain region formed in this order from the substrate side, a hollow pillar-shaped floating gate arranged so as to surround the outer periphery of the channel region in such a manner that a tunnel insulating film is interposed between the floating gate and the channel region, and a hollow pillar-shaped control gate arranged so as to surround the outer periphery of the floating gate in such a manner that an inter-polysilicon insulating film is interposed between the control gate and the floating gate. The inter-polysilicon insulating film is arranged so as to be interposed between the floating gate and the upper, lower, and inner side surfaces of the control gate.
申请公布号 US8772107(B2) 申请公布日期 2014.07.08
申请号 US201314033886 申请日期 2013.09.23
申请人 Unisantis Electronics Singapore Pte Ltd. 发明人 Masuoka Fujio;Nakamura Hiroki
分类号 H01L21/336 主分类号 H01L21/336
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. A method for manufacturing a nonvolatile semiconductor memory including a plurality of nonvolatile semiconductor memory transistors each including an island-shaped semiconductor having a hard mask in a upper portion thereof, each of the island-shaped semiconductors having a source region, a channel region, and a drain region in the order of the source region, the channel region, and the drain region from a side of a substrate, a floating gate and a control gate in the vicinity of the channel region in the order of the floating gate and the control gate from a side of the channel region, the method comprising: forming the island-shaped semiconductors in the substrate; forming a first source line in the substrate; forming insulating films on bottom portions of the island-shaped semiconductors and on the first source line; forming insulating film hard mask sidewalls on outer peripheral walls of the island-shaped semiconductors; forming a floating gate film on the insulating films and on the insulating film hard mask sidewalls; forming the floating gates in the vicinity of the channel regions by etching the floating gate film; exposing a top of the island-shaped semiconductors by etching the insulating film hard mask side walls; and forming doped regions in the island shaped semiconductors to form the drain regions.
地址 Peninsula Plaza SG