| 摘要 |
The present invention relates to a testing device for testing a current supply state of a substrate. The testing device of the present invention can quickly and reliably test the current supply state of the substrate by including a testing unit testing the current supply state of the substrate, and an index unit transferring the substrate to the testing unit by the rotational movement. The testing device of the present invention may include the testing unit testing the current supply state of the substrate and the index unit transferring the substrate to the testing unit by the rotational movement. |
