发明名称 SILICON AND SILICON GERMANIUM NANOWIRE STRUCTURES
摘要 <p>Methods of forming microelectronic structures are described. Embodiments of those methods include forming a nanowire device comprising a substrate comprising source/drain structures adjacent to spacers, and nanowire channel structures disposed between the spacers, wherein the nanowire channel structures are vertically stacked above each other.</p>
申请公布号 KR20140085604(A) 申请公布日期 2014.07.07
申请号 KR20147016438 申请日期 2011.11.23
申请人 INTEL CORP. 发明人 KUHN KELIN J.;KIM, SEI YON;RIOS RAFAEL;CEA STEPHEN M.;GILES MARTIN D.;CAPPELLANI ANNALISA;RAKSHIT TITASH;CHANG PETER;RACHMADY WILLY
分类号 H01L21/336;H01L21/20;H01L29/78 主分类号 H01L21/336
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