| 发明名称 |
TEST APPARATUS AND TEST METHOD |
| 摘要 |
Provided is a test apparatus that tests a device under test, comprising a plurality of comparators that each receive a signal under measurement output by the device under test, have a common reference level set therein, and compare a signal level of the signal under measurement to the reference level; and a signal processing section that generates a single result signal based on the plurality of comparison results output by the comparators. Also provided is a test method using the test apparatus. |
| 申请公布号 |
US2014188436(A1) |
申请公布日期 |
2014.07.03 |
| 申请号 |
US201313748604 |
申请日期 |
2013.01.24 |
| 申请人 |
ADVANTEST CORPORATION |
发明人 |
YAMAGUCHI Takahiro;ISHIDA Masahiro |
| 分类号 |
G06F15/00 |
主分类号 |
G06F15/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test apparatus that tests a device under test, comprising:
a plurality of comparators that each receive a signal under measurement output by the device under test, have a common reference level set therein, and compare a signal level of the signal under measurement to the reference level; and a signal processing section that generates a single result signal based on the plurality of comparison results output by the comparators. |
| 地址 |
Tokyo JP |
