PREDICTING A TIME OF FAILURE OF A DEVICE

摘要

The present disclosure relates generally to the field of predicting a time of failure of a device. In various examples, predicting a time of failure of a device may be implemented in the form of methods and/or algorithms.

主权项

1. A method implemented in a device for predicting a time of failure of the device, the method comprising:
receiving by the device at least one laboratory test result; generating by the device at least one physical measurement associated with the device; determining by the device a difference between information associated with the at least one received laboratory test result and information associated with the at least one generated physical measurement; generating by the device a predicted time of failure of the device, wherein the generation of the predicted time of failure of the device is based at least in part upon the determined difference between the information associated with the at least one received laboratory test result and the information associated with the at least one generated physical measurement; and outputting by the device the predicted time of failure of the device.