Pattern-based optical lens testing apparatus having a module comparing a viewed image representation to a copy of target pattern and method for using the same

摘要

A pattern method is provided for testing an optical lens. The method provides a lens for test, including a first lens surface with a focal plane in object space and a second lens surface with a focal plane in image space. Also provided is a pattern test fixture including an imaging device and a target pattern. The lens is positioned so that the imaging device is located outside the object space focal plane and the target pattern located is outside the image space focal plane. The imaging device, such as a microscope, magnification device, human eye, or camera, is used to view the target pattern. A viewed image representation of the target pattern is received in the imaging device and compared to the target pattern. More typically, the viewed image representation is compared to a target pattern copy.

主权项

1. An optical lens test fixture comprising:
a lens clamping mechanism to locate a lens in a test position, the lens including a first lens surface with a focal plane in object space and a second lens surface with a focal plane in image space; a target pattern located outside the image space focal plane; an imaging device located outside the object space focal plane, to accept a viewed image representation of the target pattern; and a calculation module comparing the viewed image representation to a copy of the target pattern stored in a memory.