发明名称 |
Permeation barrier for encapsulation of devices and substrates |
摘要 |
A permeation barrier film structure for organic electronic devices includes one or more bilayers having a hybrid permeation barrier composition. Each of the one or more bilayers includes a first region having a first composition corresponding to a first CF4—O2 Plasma Reactive Ion Etch Rate and a second region having a second composition corresponding to a second CF4—O2 Plasma Reactive Ion Etch Rate, wherein the second Etch Rate is greater than the first Etch Rate by a factor greater than 1.2 and the hybrid permeation barrier film is a homogeneous mixture of a polymeric material and a non-polymeric material, wherein the mixture is created from a single precursor material. |
申请公布号 |
US8766240(B2) |
申请公布日期 |
2014.07.01 |
申请号 |
US201012886994 |
申请日期 |
2010.09.21 |
申请人 |
Universal Display Corporation |
发明人 |
Mandlik Prashant;Silvernail Jeffrey;Ma Ruiqing |
分类号 |
H01L51/52;B32B3/00;B32B9/04 |
主分类号 |
H01L51/52 |
代理机构 |
Duane Morris LLP |
代理人 |
Duane Morris LLP |
主权项 |
1. A permeation barrier film structure for encapsulating an organic light emitting device, the permeation barrier film structure comprising:
a bilayer stack having a hybrid permeation barrier composition that comprises a homogeneous mixture of a polymeric material and a non-polymeric material, the bilayer stack comprising:
a first region directly deposited on the organic light emitting device, wherein the first region having a first composition that is a homogeneous mixture of a polymeric material and a non-polymeric material and having a first CF4—O2 Plasma Reactive Ion Etch Rate; anda second region deposited on the first region, wherein the second region having a second composition that is a homogeneous mixture of said polymeric material and said non-polymeric material and having a second CF4—O2 Plasma Reactive Ion Etch Rate, wherein the second CF4—O2 Plasma Reactive Ion Etch Rate is greater than the first CF4—O2 Plasma Reactive Ion Etch Rate by a factor greater than 1.2, wherein the first region having a maximum thickness of 1000 nm ±10 nm. |
地址 |
Ewing NJ US |