发明名称 |
METAL SHIELD STRUCTURE AND METHODS FOR BSI IMAGE SENSORS |
摘要 |
<p>A backside illumination image sensor structure includes an image sensor which is adjacent to the first side of a semiconductor substrate. An interconnection layer is formed on the first side of the semiconductor substrate. A backside illumination film is formed on the second side of the semiconductor substrate. A metal shielding layer is formed on the backside illumination film. A via is buried in the backside illumination film and connects the metal shielding layer and the semiconductor substrate.</p> |
申请公布号 |
KR20140079253(A) |
申请公布日期 |
2014.06.26 |
申请号 |
KR20130026009 |
申请日期 |
2013.03.12 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
JANGJIAN SHIU KO;JENG CHI CHERNG;CHIEN VOLUME;WANG YING LANG |
分类号 |
H01L27/146;H01L27/14 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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