发明名称 METAL SHIELD STRUCTURE AND METHODS FOR BSI IMAGE SENSORS
摘要 <p>A backside illumination image sensor structure includes an image sensor which is adjacent to the first side of a semiconductor substrate. An interconnection layer is formed on the first side of the semiconductor substrate. A backside illumination film is formed on the second side of the semiconductor substrate. A metal shielding layer is formed on the backside illumination film. A via is buried in the backside illumination film and connects the metal shielding layer and the semiconductor substrate.</p>
申请公布号 KR20140079253(A) 申请公布日期 2014.06.26
申请号 KR20130026009 申请日期 2013.03.12
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 JANGJIAN SHIU KO;JENG CHI CHERNG;CHIEN VOLUME;WANG YING LANG
分类号 H01L27/146;H01L27/14 主分类号 H01L27/146
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