发明名称 |
RESIST COMPOSITION AND MANUFACTURING METHOD OF RESIST PATTERN |
摘要 |
PROBLEM TO BE SOLVED: To provide a resist composition which allows a negative resist pattern to be manufactured with an excellent focus margin.SOLUTION: The resist composition contains: a resin which includes a structural unit represented by a formula (I) and a structural unit represented by a formula (a4) and has no acid-unstable group; a resin which includes a structural unit represented by a formula (II) and a structural unit having an acid-unstable group; and an acid generator. |
申请公布号 |
JP2014115631(A) |
申请公布日期 |
2014.06.26 |
申请号 |
JP20130226841 |
申请日期 |
2013.10.31 |
申请人 |
SUMITOMO CHEMICAL CO LTD |
发明人 |
ICHIKAWA KOJI;MIYAGAWA TAKAYUKI;NISHIMURA TAKASHI |
分类号 |
G03F7/038;C08F220/10;G03F7/039 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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