发明名称 RESIST COMPOSITION AND MANUFACTURING METHOD OF RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition which allows a negative resist pattern to be manufactured with an excellent focus margin.SOLUTION: The resist composition contains: a resin which includes a structural unit represented by a formula (I) and a structural unit represented by a formula (a4) and has no acid-unstable group; a resin which includes a structural unit represented by a formula (II) and a structural unit having an acid-unstable group; and an acid generator.
申请公布号 JP2014115631(A) 申请公布日期 2014.06.26
申请号 JP20130226841 申请日期 2013.10.31
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;MIYAGAWA TAKAYUKI;NISHIMURA TAKASHI
分类号 G03F7/038;C08F220/10;G03F7/039 主分类号 G03F7/038
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