TRANSISTOR, METHOD OF MANUFACTURING THE SAME AND ELECTRONIC DEVICE INCLUDING TRANSISTOR
摘要
<p>Disclosed are a transistor, a manufacturing method thereof, and an electronic device including the transistor. The disclosed transistor may include a channel layer containing metal nitroxide and a source electrode and a drain electrode in contact with first and second regions of the channel layer. The first and second regions of the channel layer may have a carrier concentration higher than the remaining region of the channel layer by being treated with plasma. The first and second regions may be regions treated with plasma containing hydrogen. The first and second regions may contain hydrogen. The first and second regions may have an oxygen concentration lower than the remaining region of the channel region. The first and second regions may have a nitrogen concentration higher than the remaining region of the channel layer. The metal nitroxide of the channel layer may include a ZnON-based semiconductor.</p>