| 摘要 |
<p>A system and method is provided for determining selected properties of a microplate comprising a plurality of sample wells. An example method includes the steps of performing a focusing function to determine a well surface z-position for a current x-y position based on an intensity indicative of a best focus of the well surface. The focusing function is performed again to determine a plate bottom z-position for the current x-y position based on an intensity indicative of a best focus of the plate bottom. The well surface z-position and the plate bottom z-position corresponding to each of the plurality of x-y positions are determined by repeating the steps of positioning the objective lens, performing the focusing function to determine the well surface z-position, and performing the focusing function for the plate bottom z-position. The well surface z-positions and the plate bottom z-positions at the plurality of x-y positions are then used to generate data to determine the selected properties of the microplate.</p> |
