发明名称 |
METHOD AND APPARATUS FOR FORMING C/SiC FUNCTIONALLY GRADED COATING |
摘要 |
According to an embodiment of the invention, provided is a method of forming a C/SiC functionally graded coating. In the embodiment, in a step of forming the C/SiC functionally graded coating, a reaction condition is controlled by feeding a larger amount of the oxygen gas at an early stage than a latter stage of the reaction so that a pure carbon film is formed on a surface of the substrate and then gradually decreasing the amount of the oxygen gas so that a SiC film having a higher concentration with an increasing distance from the surface of the substrate is formed. |
申请公布号 |
US2014161978(A1) |
申请公布日期 |
2014.06.12 |
申请号 |
US201314077502 |
申请日期 |
2013.11.12 |
申请人 |
Industry-Academic Cooperation Foundation, Yonsei University |
发明人 |
CHOI Doo Jin;CHOI YooYoul |
分类号 |
C23C16/32 |
主分类号 |
C23C16/32 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a C/SiC functionally graded coating, the method comprising the following steps of:
placing a substrate on which a C/SiC functionally graded coating is to be formed inside a reaction furnace in which the C/SiC functionally graded coating is formed; heating the reaction furnace, and forming the C/SiC functionally graded coating on the substrate by feeding a reactant gas containing carbon and silicon together with oxygen gas into the reaction furnace to thus cause a reaction between the reactant gas and the oxygen gas, wherein in the step of forming the C/SiC functionally graded coating, a reaction condition is controlled by feeding a larger amount of the oxygen gas at an early stage than a latter stage of the reaction so that a substantially pure carbon film is formed on a surface of the substrate and then gradually decreasing the amount of the oxygen gas so that a SiC film having a higher concentration with an increasing distance from the surface of the substrate is formed.
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地址 |
Seoul KR |