发明名称 DEEP DEPLETED CHANNEL MOSFET WITH MINIMIZED DOPANT FLUCTUATION AND DIFFUSION LEVELS
摘要 CMOS devices are fabricated with a channel layer having minimized dopant fluctuation and diffusion. Embodiments include forming a dummy gate, on a substrate, between a pair of spacers, forming, in the substrate, a source and drain separated by a ground plane layer, removing the dummy gate from the substrate, forming a cavity between the pair of spacers, forming, after removal of the dummy gate, a channel layer on the substrate, forming a high-k layer on the channel layer and on side surfaces of the cavity, and forming a replacement gate in the cavity.
申请公布号 US2014159168(A1) 申请公布日期 2014.06.12
申请号 US201414177983 申请日期 2014.02.11
申请人 GLOBALFOUNDRIES Singapore Pte. Ltd. 发明人 TOH Eng Huat;TAN Shyue Seng
分类号 H01L29/78 主分类号 H01L29/78
代理机构 代理人
主权项 1. A device comprising: a substrate; a source and a drain in the substrate, separated by a ground plane layer; a channel layer over the ground plane layer, the channel layer being formed after all high thermal steps are performed to the device; a gate electrode over the channel layer; and a high-k layer on side surfaces of the gate electrode and between the channel layer and the gate electrode.
地址 Singapore SG