| 摘要 |
FIELD: physics.SUBSTANCE: method of profiling bottom deposits involves mounting radiating and receiving antennae of a profile recorder on a towed carrier, wherein the radiating and receiving antennae of the profile recorder are separately mounted on the carrier, and the receiving antenna used is a K-element receiving antenna directed along the longitudinal axis of the carrier. The carrier is towed over the bottom. A pulsed acoustic phase-shift keyed signal, which is modulated by an M-sequence, is emitted. The reflected signal is received and undergoes correlation processing with a copy of the emitted acoustic phase-shift keyed signal, wherein amplification and correlation processing of the received signal is carried out with a K-channel receiving circuit. After amplification and correlation processing of signals received by each element of the K-element receiving antenna, Q values of the complex amplitude of the received signalare generated. A matrix is formed from Q row elements. Time delay is calculated for each emission time tand arrival time t. Time shift and coherent summation operations are repeated for the entire array of data for each element of the receiving antenna. Coherent summation of K signals received by the K-element receiving antenna is performed for each time of arrival of received signals tand time of emission t. Graphic construction of the profile of bottom deposits is then performed based on the delay time of the reflected signal.EFFECT: higher resolution of the method of profiling in a longitudinal direction while maintaining a sufficiently large depth of profiling and high resolution in the vertical direction.2 dwg |
