发明名称 METHOD OF FORMING SEMICONDUCTOR FINS
摘要 An improved method of forming semiconductor fins is disclosed. Cavities are formed by etching a semiconductor substrate to a first depth. A surface treatment layer such as a nitride layer is then deposited or formed on the interior surface of the cavities. The etch then continues deeper, while the surface treatment layer protects the upper portion of the cavities.
申请公布号 US2014148011(A1) 申请公布日期 2014.05.29
申请号 US201213688258 申请日期 2012.11.29
申请人 GLOBALFOUNDRIES INC.;GLOBALFOUNDRIES INC. 发明人 CHOI DAE-HAN;YANG DAE GEUN;MAENG CHANG HO
分类号 H01L21/3065 主分类号 H01L21/3065
代理机构 代理人
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