发明名称 Method of manufacturing dual damascene structure
摘要 A method for fabricating a dual damascene structure includes the following steps. At first, a dielectric layer, a dielectric mask layer and a metal mask layer are sequentially formed on a substrate. A plurality of trench openings is formed in the metal mask layer, and a part of the metal mask layer is exposed in the bottom of each of the trench openings. Subsequently, a plurality of via openings are formed in the dielectric mask layer, and a part of the dielectric mask layer is exposed in a bottom of each of the via openings. Furthermore, the trench openings and the via openings are transferred to the dielectric layer to form a plurality of dual damascene openings.
申请公布号 US8735295(B2) 申请公布日期 2014.05.27
申请号 US201213526554 申请日期 2012.06.19
申请人 LEE CHANG-HSIAO;CHEN HSIN-YU;LAI YU-TSUNG;LIAO JIUNN-HSIUNG;TSAI SHIH-CHUN;UNITED MICROELECTRONICS CORP. 发明人 LEE CHANG-HSIAO;CHEN HSIN-YU;LAI YU-TSUNG;LIAO JIUNN-HSIUNG;TSAI SHIH-CHUN
分类号 H01L21/311 主分类号 H01L21/311
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