发明名称 |
METHOD FOR MANUFACTURING MASK PATTERN, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PROGRAM FOR MANUFACTURING MASK PATTERN |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a low-cost semiconductor device that can be miniaturized.SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: forming a first photoresist pattern on a first film; curing the first photoresist pattern; forming a second photoresist pattern on the first film so as to partially overlap with the first photoresist pattern in a planar view; and etching the first film using the first and second photoresist patterns as a mask.</p> |
申请公布号 |
JP2014096477(A) |
申请公布日期 |
2014.05.22 |
申请号 |
JP20120247339 |
申请日期 |
2012.11.09 |
申请人 |
PS4 LUXCO S A R L |
发明人 |
MUTO AKIRA |
分类号 |
H01L21/027;C23F1/00;G03F7/20;H01L21/3213;H01L21/768;H01L23/522 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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