发明名称 METHOD FOR MANUFACTURING MASK PATTERN, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND PROGRAM FOR MANUFACTURING MASK PATTERN
摘要 <p>PROBLEM TO BE SOLVED: To provide a low-cost semiconductor device that can be miniaturized.SOLUTION: A method of manufacturing a semiconductor device comprises the steps of: forming a first photoresist pattern on a first film; curing the first photoresist pattern; forming a second photoresist pattern on the first film so as to partially overlap with the first photoresist pattern in a planar view; and etching the first film using the first and second photoresist patterns as a mask.</p>
申请公布号 JP2014096477(A) 申请公布日期 2014.05.22
申请号 JP20120247339 申请日期 2012.11.09
申请人 PS4 LUXCO S A R L 发明人 MUTO AKIRA
分类号 H01L21/027;C23F1/00;G03F7/20;H01L21/3213;H01L21/768;H01L23/522 主分类号 H01L21/027
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