发明名称 |
System and method for classifying media defects based on a ratio of harmonics |
摘要 |
<p>The disclosure is directed to a system and method for detecting and classifying at least one media defect. A periodic pattern is written to a medium to yield at least one waveform. The magnitude of the waveform is compared against a defect threshold to detect the presence or absence of media defects in the medium. When at least one defect is detected, a magnitude for each of at least two harmonics of the waveform is determined in the defect range. The defect is classified by comparing a ratio of the magnitudes of the at least two harmonics against a classification threshold.</p> |
申请公布号 |
EP2733702(A1) |
申请公布日期 |
2014.05.21 |
申请号 |
EP20130189246 |
申请日期 |
2013.10.18 |
申请人 |
LSI CORPORATION |
发明人 |
DZIAK, SCOTT M.;JIN, MING;DYKHUIS, JONATHAN |
分类号 |
G11B20/18 |
主分类号 |
G11B20/18 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|