发明名称 Semiconductor apparatus and manufacturing method of same
摘要 Disclosed is a thin-film transistor (10) manufacturing method that includes a process for forming a nitrate film (12x) that includes residual nickel (22) on a surface thereof, by bringing a nitric acid solution into contact with a polysilicon layer (11x); and a process for removing the nitrate film (12x) that includes residual nickel (22) from the polysilicon layer (11x) surface. With this surface treatment process, a polysilicon layer (11) with reduced concentration of a surface residual nickel (22) is provided, and a thin-film transistor (10) having excellent surface smoothness is attained.
申请公布号 US8728941(B2) 申请公布日期 2014.05.20
申请号 US201113634784 申请日期 2011.03.02
申请人 IMAI SHIGEKI;SHIMATANI TAKAFUMI;KOBAYASHI HIKARU;SHARP KABUSHIKI KAISHA 发明人 IMAI SHIGEKI;SHIMATANI TAKAFUMI;KOBAYASHI HIKARU
分类号 H01L21/302;H01L21/461 主分类号 H01L21/302
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