| 摘要 |
PROBLEM TO BE SOLVED: To provide a contact probe that can include a head of a different material, has a low profile, and exhibits excellent performance and productivity.SOLUTION: (1) A thin-plate plunger 1 comprises: an upper contact end 7 having a flat and uneven surface for contacting a substrate and semiconductor, on one end; a thin-plate plunger tip end cylinder part 9; a thin-plate plunger coil spring slip-off prevention part 5; a thin-plate plunger internal half-cylinder part 10; a slide contact surface 14; and an internal slip-off prevention part 4. (2) A thin-plate barrel 3 includes: a lower contact end 6 having a flat and uneven surface for contacting the substrate and semiconductor, on one end; a thin-plate barrel tip end cylinder part 11; a thin-plate barrel coil spring slip-off prevention part 15; a thin-plate barrel internal half-cylinder part 12; the slide contact surface 14; and the internal slip-off prevention part 4. In face-to-face combination with the internal slip-off prevention part 4 of the thin-plate plunger, a coil spring 2 is incorporated between the thin-plate plunger coil spring slip-off prevention part and the thin-plate barrel coil spring slip-off prevention part . |
