发明名称 SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing characteristic deterioration caused by miniaturization, and a method for manufacturing the same.SOLUTION: A semiconductor device according to an embodiment comprises a ground layer and a plurality of transistors arranged in a plane parallel to an upper surface of the ground layer on the ground layer. Each of the plurality of transistors includes a channel which passes current in a first direction crossing the plane. The ground layer includes a first region and a second region provided next to the first region in the plane. Channels of a plurality of the transistors provided on the first region among the plurality of transistors have a first crystal orientation. Channels of a plurality of the transistors provided on the second region among the plurality of transistors have a second crystal orientation different from the first crystal orientation.</p>
申请公布号 JP2014093319(A) 申请公布日期 2014.05.19
申请号 JP20120241137 申请日期 2012.10.31
申请人 TOSHIBA CORP 发明人 SAITO MASUMI
分类号 H01L29/786;H01L21/20;H01L21/336;H01L21/8247;H01L27/10;H01L27/105;H01L27/115;H01L29/12;H01L29/78;H01L29/788;H01L29/792 主分类号 H01L29/786
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