STAND ALONE MULTI-CELL PROBE CARD FOR AT-SPEED FUNCTIONAL TESTING

摘要

A probe card includes at least two connection arrangements on a printed circuit board and a daughter board connected to the printed circuit board through one of the connection arrangements. The daughter board includes a plurality of cell modules, with each of the cell modules having a socket for receiving a device under test and each of the connection arrangements of the printed circuit board being connectable to each of predetermined daughter boards respectively.