发明名称 TEST SYSTEM AND METHOD FOR COMPUTER
摘要 A test system for a computer includes a basic input/output system (BIOS) chip, a platform controller hub (PCH) chip, and a baseboard management controller (BMC) chip. The PCH chip performs a test on a component of the computer according to a control instruction outputted by the BIOS chip to determine an operation state of the component. The PCH chip outputs state signals to the BMC chip through a corresponding general purpose input output (GPIO) pin according to a test result of the component. The BMC chip obtains test information according to the state signals received from the corresponding GPIO pin.
申请公布号 US2014129821(A1) 申请公布日期 2014.05.08
申请号 US201314065476 申请日期 2013.10.29
申请人 HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD. 发明人 TIAN BO;WU KANG
分类号 G06F9/44 主分类号 G06F9/44
代理机构 代理人
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