发明名称 Solid-state imaging apparatus
摘要 <p>In a region of a weak internal electric field, photocharges generated in a region deeper than the photodiode are diffused laterally to lower the sensitivity by photoelectrons flowing into adjacent pixels, etc (crosstalk). An anti-crosstalk layer is disposed in the photodiode forming portion, and between a pixel region and a peripheral circuit region. Crosstalk between a pixel and a pixel or between a pixel region and a peripheral circuit region is decreased to improve the photosensitivity. </p>
申请公布号 EP2565925(A3) 申请公布日期 2014.05.07
申请号 EP20120004985 申请日期 2012.07.05
申请人 HITACHI, LTD. 发明人 FURUKAWA, TOMOYASU;SAKAI, SATOSHI;NONAKA, YUSUKE;SUGINO, SHINYA
分类号 H01L27/146 主分类号 H01L27/146
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