发明名称 Specimen analysis apparatus
摘要 A specimen analysis device is disclosed by an embodiment of the present invention. The specimen analysis device comprises the following: a sensor unit for detecting the location of a specimen analysis kit; an image taking unit; and a controller takes at least one image of a reaction region or an identifying code region of the specimen analysis kit when one mode is selected among first and second modes by a predetermined standard and a preset sensing value is received from the sensor unit, and analyzing a specimen reaction result based on the taken image of the reaction region or the identifying code region by the selected mode. [Reference numerals] (AA) Start; (S400) Receive user input for selecting a mode; (S410) Set the mode by inputting; (S420) Operate in a first mode; (S430) Operate in a second mode
申请公布号 KR101388841(B1) 申请公布日期 2014.04.24
申请号 KR20120096619 申请日期 2012.08.31
申请人 发明人
分类号 G01N21/00;G01N33/53 主分类号 G01N21/00
代理机构 代理人
主权项
地址