| 摘要 |
PURPOSE: A device for measuring a phase difference and a main axis of a three-dimension film and a measuring method thereof are provided to measure the phase difference and the main axis in a one-dimension domain of the film simultaneously on a real time basis. CONSTITUTION: A device for measuring a phase difference and a main axis of a three-dimension film is as follows. The lights polarized by a polarizing plate(11) are penetrated through a sample of the three-dimension film. The lights penetrated through the sample are penetrated through a wedge-shaped birefractive prism(15) and a test plate(16) which are aligned to be parallel with a main axis of the sample successively so that two orthogonal components of an electric field are joined. The joined orthogonal components are overlapped so that interference patterns are formed. The main axis and the phase difference of the sample are calculated based on the interference patterns. |
