发明名称 METHOD FOR ANALYSING SAMPLE USING LASER ABLATION ICP ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for analysing a sample, which can perform continuous analysis of the sample efficiently.SOLUTION: The method for analysing a sample uses a laser ablation ICP analysis method, and includes: a step 1 of taking out a holder sequentially from a sample arrangement part in which a plurality of holders each provided with a sample are arranged, and placing the holder at a predetermined position of a holder transfer part; a step 2 of measuring a position of the sample by irradiating with a laser beam the sample provided in the holder on the holder transfer part; a step 3 of transferring the holder after the position measurement to a laser ablation part; a step 4 of irradiating the sample provided in the holder with a laser beam by the laser ablation part to analyse the sample; a step 5 of transferring the holder provided with the analysed sample to a predetermined position for taking out the holder; and a step 6 of returning the holder, transferred to the predetermined position for taking out the holder, to the sample arrangement part.
申请公布号 JP2014070922(A) 申请公布日期 2014.04.21
申请号 JP20120215131 申请日期 2012.09.27
申请人 JX NIPPON MINING & METALS CORP 发明人 KAMIMURA KENICHI
分类号 G01N21/73;G01N1/22;G01N27/62 主分类号 G01N21/73
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