发明名称 LASER SCANNING MICROSCOPE DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a laser scanning microscope device that has high in-plane resolution, high resolution with respect to a height out of the plane and to refractive index distribution, and that allows easy measurement and observation with a wide measurement range.SOLUTION: A combining optical system 1 combines two laser beams having wavelengths different from each other and emits the combined beam. An acoustooptic element 3 modulates the respective laser beams into the beams having two frequencies, and emits the beams to a different direction from each other. A two-dimensional scanning device 6 two-dimensionally scans the beams, separates a part of the beams with a beam splitter 7, and light receiving elements 81, 83 photoelectrically convert the beams and send a beat signal of each of the beams. Pupil transmission lens systems 5, 10 bring the beams from the combining optical system 1 close to each other, and emit the beams to an object S through an objective lens 17. Light receiving elements 91, 93 photoelectrically convert the reflection beams from the object S to send a beat signal of each of the beams. A signal comparator 15 detects phase differences obtained based on beat signals from the light receiving elements 81, 83, 91 and 93, and a data processing part 16 obtains information of the object S.
申请公布号 JP2014071432(A) 申请公布日期 2014.04.21
申请号 JP20120220056 申请日期 2012.10.02
申请人 ASTRO DESIGN INC 发明人 TAKEI TOSHIJI;TAKEDA SHIGETO;SUZUKI SHIGEAKI
分类号 G02B21/00;G01B11/24 主分类号 G02B21/00
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