发明名称 PARAMETER SCANNING FOR SIGNAL OVER-SAMPLING
摘要 A method and apparatus for parameter scanning for signal over-sampling. An embodiment of an apparatus includes an equalizer to equalize received data values, and a sampler to over-sample the equalized data. The apparatus includes an eye monitor to generate information regarding quality of signal eyes for the over-sampled data, and an equalization monitor to generate information regarding sufficiency of signal equalization. The apparatus further includes a scan engine to scan possible values of a plurality of parameters for the apparatus.
申请公布号 KR101385261(B1) 申请公布日期 2014.04.16
申请号 KR20070094956 申请日期 2007.09.18
申请人 发明人
分类号 H04B17/00 主分类号 H04B17/00
代理机构 代理人
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