| 摘要 |
PROBLEM TO BE SOLVED: To obtain an inspection device by which abnormality is easily detected with a comparatively simple configuration.SOLUTION: The inspection device comprises: a first light source illuminating an oblong inspection object with light from one side in the longitudinal direction of the oblong inspection object; a second light source illuminating the inspection object with the light from the other side in the longitudinal direction; a plurality of image acquisition parts including a mirror part positioned between the first light source and the second light source in the longitudinal direction and reflecting the inspection object and an imaging part acquiring the first image of the inspection object when the inspection object is illuminated from one side with the light of the first light source and the second image of the inspection object when the inspection object is illuminated from the other side with the light of the second light source through the mirror part, in such a state that the inspection object is conveyed in the longitudinal direction; and a detection part detecting the abnormality of the inspection object by using the first image and the second image. |
