发明名称 |
HARDMASK |
摘要 |
PROBLEM TO BE SOLVED: To provide new hardmask compositions for an electronic device substrate that can be used to form a hardmask film with a high cross-link density and with excellent solvent resistance.SOLUTION: A composition is selected from: (i) an oligomer comprising metal-containing pendant groups represented by the formula (1); (ii) an oligomer represented by the formula (2); and their mixture. The composition provides a metal oxide hardmask having a range of etch selectivity. Also provided are methods of depositing metal oxide hardmasks using the compositions. |
申请公布号 |
JP2014062253(A) |
申请公布日期 |
2014.04.10 |
申请号 |
JP20130196367 |
申请日期 |
2013.09.24 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS LLC |
发明人 |
WANG DEYAN;SUN JIBIN;CHUANG PENG-WEI;PETER TREFONAS III;LIU KONG |
分类号 |
C08F2/00;C08F20/06;C08G79/00;H01L21/027 |
主分类号 |
C08F2/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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