发明名称 WIRE CURVATURE MONITORING SYSTEM DEDICATED TO WIRE SAW
摘要 PROBLEM TO BE SOLVED: To provide a wire curvature monitoring system dedicated to a semiconductor wire saw device.SOLUTION: The wire curvature monitoring system includes a sensor array configured so as to be positioned to neighbor a wire of a wire saw device. The sensor array is adapted to detect wire curvature and includes at least one of an inductive sensor, a capacitive sensor, and a contact sensor.
申请公布号 JP2014060397(A) 申请公布日期 2014.04.03
申请号 JP20130187972 申请日期 2013.09.11
申请人 APPLIED MATERIALS SWITZERLAND SA 发明人 EL HADDAOUI NAJIB
分类号 H01L21/304;B24B27/06;B28D5/04 主分类号 H01L21/304
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