发明名称 |
WIRE CURVATURE MONITORING SYSTEM DEDICATED TO WIRE SAW |
摘要 |
PROBLEM TO BE SOLVED: To provide a wire curvature monitoring system dedicated to a semiconductor wire saw device.SOLUTION: The wire curvature monitoring system includes a sensor array configured so as to be positioned to neighbor a wire of a wire saw device. The sensor array is adapted to detect wire curvature and includes at least one of an inductive sensor, a capacitive sensor, and a contact sensor. |
申请公布号 |
JP2014060397(A) |
申请公布日期 |
2014.04.03 |
申请号 |
JP20130187972 |
申请日期 |
2013.09.11 |
申请人 |
APPLIED MATERIALS SWITZERLAND SA |
发明人 |
EL HADDAOUI NAJIB |
分类号 |
H01L21/304;B24B27/06;B28D5/04 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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