发明名称 Resist composition, method of forming resist pattern and polymeric compound
摘要 A resist composition including a base component (A) which exhibits changed solubility in a developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the base component (A) containing a polymeric compound (A1) having a structural unit (a5) represented by general formula (a5-0) shown below (R1 represents a sulfur atom or an oxygen atom; R2 represents a single bond or a divalent linking group; and Y represents an aromatic hydrocarbon group or an aliphatic hydrocarbon group having a polycyclic group, provided that the aromatic hydrocarbon group or the aliphatic hydrocarbon may have a carbon atom or a hydrogen atom thereof substituted with a substituent.
申请公布号 US8685620(B2) 申请公布日期 2014.04.01
申请号 US201213670106 申请日期 2012.11.06
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 TAKAKI DAICHI;SHIONO DAIJU;UTSUMI YOSHIYUKI;KAIHO TAKAAKI
分类号 G03F7/039;G03F7/20;G03F7/30 主分类号 G03F7/039
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