发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, METHOD OF PROCESSING SUBSTRATE, SUBSTRATE PROCESSING APPARATUS AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM
摘要 The present invention can reduce a stress of a layer which is formed on a substrate. The present invention includes a substrate input process of supplying the substrate into a process room; a layer formation process of forming a layer on the substrate by supplying a process gas to the substrate while heating the substrate with first temperate; a stress control process of controlling a stress to change the stress value of the layer formed on the substrate by supplying the plasma-excited process gas to the substrate while the temperature of the substrate is changed to a second temperature which is different from the first temperature; and a substrate output process of discharging the substrate from the process room. [Reference numerals] (AA) Layer formation process; (BB) Stress control process; (CC) Wafer temperature; (DD) NH_3 flow; (EE) Plasma; (FF) Plasma irradiation time; (GG) Time
申请公布号 KR20140038298(A) 申请公布日期 2014.03.28
申请号 KR20130102127 申请日期 2013.08.28
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 KAGA YUKINAO;SAKAI MASANORI;YOKOGAWA TAKASHI
分类号 H01L21/205 主分类号 H01L21/205
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