发明名称 |
Atomic layer deposition of transition metal thin films |
摘要 |
An atomic layer deposition method for forming metal films on a substrate comprises a deposition cycle including: a) contacting a substrate with a vapor of a metal-containing compound described by formula 1 for a first predetermined pulse time to form a first modified surface: MLn (1) wherein: n is 1 to 8; M is a transition metal; L is a ligand; b) contacting the first modified surface with an acid for a second predetermined pulse time to form a second modified surface; and c) contacting the second modified surface with a reducing agent for a third predetermined pulse time to form a metal layer. |
申请公布号 |
GB2506317(A) |
申请公布日期 |
2014.03.26 |
申请号 |
GB20140000262 |
申请日期 |
2012.06.05 |
申请人 |
WAYNE STATE UNIVERSITY |
发明人 |
CHARLES H WINTER;THOMAS J KNISLEY;THILOKA ARIY-ASENA |
分类号 |
C23C16/455;C23C16/18 |
主分类号 |
C23C16/455 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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