发明名称 Atomic layer deposition of transition metal thin films
摘要 An atomic layer deposition method for forming metal films on a substrate comprises a deposition cycle including: a) contacting a substrate with a vapor of a metal-containing compound described by formula 1 for a first predetermined pulse time to form a first modified surface: MLn (1) wherein: n is 1 to 8; M is a transition metal; L is a ligand; b) contacting the first modified surface with an acid for a second predetermined pulse time to form a second modified surface; and c) contacting the second modified surface with a reducing agent for a third predetermined pulse time to form a metal layer.
申请公布号 GB2506317(A) 申请公布日期 2014.03.26
申请号 GB20140000262 申请日期 2012.06.05
申请人 WAYNE STATE UNIVERSITY 发明人 CHARLES H WINTER;THOMAS J KNISLEY;THILOKA ARIY-ASENA
分类号 C23C16/455;C23C16/18 主分类号 C23C16/455
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