METHOD FOR MEASURING OPTICAL FILM AND MASK FOR MEASURING OPTICAL FILM

摘要

PROBLEM TO BE SOLVED: To easily and accurately measure optical characteristics of an optical film such as a patterned retardation film relating to three-dimensional image display employing a passive system.SOLUTION: A method for measuring an optical film includes: an alignment step of laminating and aligning a measurement mask 11 to an optical film 1; and a measurement step of measuring optical characteristics of the optical film 1 by receiving light transmitted through the laminate of the optical film 1 and the measurement mask 11 aligned in the alignment step. The measurement mask 11 is provided with a first measurement region AA where an opening S corresponding only to a first region A is formed. In the alignment step, the measurement mask 11 is aligned to the optical film 1 so as to overlap the opening S formed in the first measurement region AA only on the corresponding first region A.