| 摘要 |
PROBLEM TO BE SOLVED: To accurately detect the temperature of a semiconductor integrated circuit device by solving a problem, in which if a method using a band gap reference is used to improve a detection accuracy, the area of an analog element that is included in the semiconductor integrated circuit device increases and if a method of detecting the temperature of the semiconductor integrated circuit device by using a leak current is used, the circuit area can be reduced but the leak current fluctuates due to the fluctuation of a power supply voltage, thereby causing deterioration of the detection accuracy.SOLUTION: Capacitors that are charged and discharged by a leak current that fluctuates according to a temperature are provided for both a first power supply side and a second power supply side, thereby improving the accuracy of temperature detection. |
